By G. W. A. Dummer, J. Mackenzie Robertson
Anglo-American Microelectronics info 1968-69, quantity : brands R-Z provides info at the beneficial properties of the layout, building and alertness of microelectronic units. The ebook discusses the positive factors of the layout, building and alertness of radiation built-in circuits; Raytheon built-in circuits; RCA built-in circuits; and Signetics built-in circuits. The textual content additionally describes the good points of the layout, development and alertness of Siliconix built-in circuits; Sperry built-in circuits; Sprague built-in circuits; and STC thick movie circuits. The gains of the layout, building and alertness of Stewart-Warner micro circuits; Sylvania built-in circuits; Texas tools semiconductor networks; and transitron built-in circuits also are encompassed. The ebook additional tackles the positive aspects of the layout, development and alertness of Varo hybrid movie built-in circuits; Welwyn thick movie and skinny movie resistor networks; Westinghouse built-in circuits; and Zeltex hybrid built-in circuits. Designers, dealers, and clients of microelectronic units will locate the publication valuable.
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Additional info for Anglo–American Microelectronics Data 1968–69. Manufacturers R–Z
If still criteria higher levels of reliability are required, additional can be added nominal cost. to the basic Reliability Program at ,r ~ A RD-209 (Contd) RADIATION INTEGRATED CIRCUITS TYPICAL PERFORMANCE CHARACTERISTICS 1585 Continued RADIATION RD-211 DUAL 4-INPUT LOGIC GATE EXPANDER The integrated circuit covered by this data sheet forms part of Radiation's family of 200 and 300 Series DTL circuits intended for use in ultra-high speed, low-power digital systems. The circuit is fabricated within a single monolithic silicon chip using passivated epitaxial techniques and Radiation's DIELECTRIC ISOLATION method.
These tests are performed periodically during the manufacturing period on a production lot of a representative circuit type. The circuit type selected each period is changed routinely and is representative of all structurally similar devices produced on the same line by the same processes during that period. Group C tests (Table IV) are intended to verify design parameters that are not specifically measured in Group A or B but are guaranteed by consideration of related measurements in those two series.
5. Adjust test pulse generator output as required to obtain maximum toggle frequency. 1600 RD-221/321 (Contd) RADIATION I N T E G R A T E D CIRCUITS SUGGESTED LOADING RULES DYNAMIC TEST CIRCUIT WAVE FORMS 1601 Continued RADIATION DIODE RM-13/RM-34/RM-77 MATRICES ( 5 x 8 , 6 x 8 and 5 x 5 ) Radiation's monolithic diode matrices consist of arrays of passivated silicon diodes, fabricated in DIELECTRICALLY ISOLATED moats. Use of improved epitaxial techniques allow construction of arrays using the epitaxial layer as the common cathode connection for all diodes in CIRCUIT SCHEMATICS a row - C o l u m n connections to the anode side of the diodes are made to metalized interconnect lines via fusible links.
Anglo–American Microelectronics Data 1968–69. Manufacturers R–Z by G. W. A. Dummer, J. Mackenzie Robertson